Dr. Ken Nakajima completed his doctorate in applied physics with the development and application of various types of scanning probe microscope (SPM) to polymeric materials at the University of Tokyo, Japan, under the supervision of Prof. Toshio Nishi, in 1997. After a post-doctorate in RIKEN, Japan, he joined Tokyo Institute of Technology, Japan, in 2003, where he directed his research on the basic study of rubber elasticity and reinforcement using an atomic force microscope (AFM). This study led to the development of AFM-based nanomechanics in 2005. In 2008, he moved to WPI-Advanced Institute for Materials Research, Tohoku University, Japan, as Associate Professor. Then, he was promoted to be Professor at Tokyo Institute of Technology in 2015, where he continued the application of AFM nanomechanics to various types of polymeric materials. He published 176 papers with 3,058 citations, which results in the h-index of 33.